KIPL

KIPL

Katedra inženýrství pevných látek, FJFI, ČVUT v Praze

KIPL

Katedra inženýrství pevných látek, FJFI, ČVUT v Praze

Fields of research

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Laboratoř strukturní rentgenografie katedry inženýrství pevných látek FJFI ČVUT je pracoviště vědecké i pedagogické. Kromě výuky studentů se ve své vědecko-výzkumné činnosti tradičně zaměřuje především na rtg difrakční studium stavu zbytkové napjatosti v polykrystalických kovových i keramických materiálech.

Přístrojové vybavení laboratoře bylo v posledních letech výrazně inovováno a dnes umožňuje rovněž zkoumat kvalitativně i kvantitativně fázové složení a přednostní orientace (textury) polykrystalických materiálů. Tyto charakteristiky reálné krystalové struktury pevných látek patří mezi základní parametry, jejichž znalost je nepostradatelná při návrhu nových progresivních materiálů a optimalizaci požadovaných užitných vlastností.

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Fields of research

The X-ray diffraction laboratory at the Department of Solid State Engineering at FNSPE, CTU in Prague is a scientific and pedagogical workplace. In addition to teaching students, research activities are focused primarily on X‑ray diffraction studies of residual stress states in polycrystalline metallic and ceramic materials. The instrumentation of the laboratory has been significantly upgraded in recent years and today also enables the qualitative and quantitative investigation of the phase composition and preferred orientation (texture) of polycrystalline materials. These characteristics of the real crystal structure of solids belong among the fundamental parameters whose understanding is indispensable for designing new advanced materials and optimizing their desired functional properties.

Operational reliability and service life of engineering products depend not only on the composition of used materials but also on the technological procedures used in their processing. Nondestructive X‑ray methods are employed to determine residual stresses that arise inside components as a result of external forces or other factors (such as temperature fields, phase transformations, etc.), either directly or indirectly (for example, as a consequence of inhomogeneous deformation). Residual stress analysis therefore plays an important role in material diagnostics comparable to that of classical methods for investigating material properties, such as strength, hardness, wear resistance, or corrosion resistance.

The range of problems addressed in the X‑ray diffraction laboratory, both within basic and applied research projects and in response to requests from domestic and international partners, is remarkably diverse. Industrial collaborators have been interested in the distribution of residual stresses in the surface layers of coil springs, passenger‑car gearboxes, locomotive axles, etc.. The laboratory has also investigated the effectiveness of various mechanisms responsible for the relaxation of residual stresses in machine parts as well as in specially prepared laboratory samples of nickel‑based heat‑resistant alloys for the nuclear industry. In recent years, research has expanded beyond bulk metals and alloys to include plasma‑sprayed oxide, ceramic, and other thin films exhibiting structural and functional gradients.

The research carried out is a representative example of how physical engineers are educated at the FNSPE, CTU in Prague: from a thorough understanding of the theory of physical processes, through the preparation and execution of experiments focused on the real structure of solids, all the way to the application of laboratory research results in industrial practice.

The laboratory cooperates with leading industrial companies in the Czech Republic and with foreign institutions, see References.

Main experimental equipment

  • Diffractometer Empyrean (PANalytical) with the efficient position sensitive 1Der detector with high energy resolution and with accessories for the study of thin films and textures.
  • Diffractometer X'Pert PRO MPD (PANalytical) with high efficiency X'Cellerator position sensitive detector with texture study accessories.
  • HTK 2000N high-temperature chamber for in-situ x-ray diffraction studies up to 2300 °C.
  • Two x-ray diffraction devices with area detection of diffraction patterns SEIFERT ID 3003 from GE Inspection Technologies, where a modern two-dimensional solid-state detector (imaging plate) is used instead of X-ray film.
  • LectroPol 5 device for defined gradual electrolytic removal of surface layers necessary for the study of depth courses of structurally sensitive characteristics.
  • Proto Electropolisher Model 8818-V3 mobile device for defined gradual electrolytic removal of surface layers.

Researched projects

References

en_US